English
Chinese (Traditional)
French
German
Japanese
Korean
Equipment Selection to Meet Your Needs
Shop Thousands
of Semiconductor Manufacturing Solutions
884 products
| Asset # | Image | Title | Make | Model | Type | Wafer Size |
|---|---|---|---|---|---|---|
| 59125 |
|
Hitachi I 6300 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | I 6300 | CD-SEM (Critical Dimension Scanning Electron Microscope) | - |
| 59126 |
|
Hitachi RS 4000 DR-SEM (Defect Review Scanning Electron Microscope) |
Hitachi | RS 4000 | DR-SEM (Defect Review Scanning Electron Microscope) | 8 inch |
| 59127 |
|
Hitachi S 4700 I SEM (Scanning Electron Microscope) |
Hitachi | S 4700 I | SEM (Scanning Electron Microscope) | - |
| 59128 |
|
Hitachi LS 6800 Wafer Surface Inspection System |
Hitachi | LS 6800 | Wafer Surface Inspection System | - |
| 59129 |
|
Hitachi S 4700 II FE-SEM (Field Emission Scanning Electron Microscope) |
Hitachi | S 4700 II | FE-SEM (Field Emission Scanning Electron Microscope) | - |
| 59130 |
|
Hitachi UA 7200 Asher / Stripper |
Hitachi | UA 7200 | Asher / Stripper | 8 inch |
| 59514 |
|
Hitachi S 3400 E VP-SEM (Variable Pressure Scanning Electron Microscope) |
Hitachi | S 3400 E | VP-SEM (Variable Pressure Scanning Electron Microscope) | - |
| 59525 |
|
Hitachi S 4500 II |
Hitachi | S 4500 II | - | - |
| 59588 |
|
Hitachi IML 6 1 Ion Mill |
Hitachi | IML 6 1 | Ion Mill | 6 inch |
| 59589 |
|
Hitachi CG 4000 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | CG 4000 | CD-SEM (Critical Dimension Scanning Electron Microscope) | 6 inch |
| 59590 |
|
Hitachi IM 4000 Ion Mill |
Hitachi | IM 4000 | Ion Mill | - |
| 59591 |
|
Hitachi NE 4000 Nanoprober |
Hitachi | NE 4000 | Nanoprober | - |
| 59592 |
|
Hitachi S 3400 N SEM Review (Scanning Electron Microscope) |
Hitachi | S 3400 N | SEM Review (Scanning Electron Microscope) | - |
| 59593 |
|
Hitachi S 3700 N SEM (Scanning Electron Microscope) |
Hitachi | S 3700 N | SEM (Scanning Electron Microscope) | - |
| 59594 |
|
Hitachi S 4500 SEM (Scanning Electron Microscope) |
Hitachi | S 4500 | SEM (Scanning Electron Microscope) | - |
| 59595 |
|
Hitachi S 4700 SEM (Scanning Electron Microscope) |
Hitachi | S 4700 | SEM (Scanning Electron Microscope) | - |
| 59596 |
|
Hitachi S 4800 SEM (Scanning Electron Microscope) |
Hitachi | S 4800 | SEM (Scanning Electron Microscope) | - |
| 59597 |
|
Hitachi TM 3000 Microscope |
Hitachi | TM 3000 | Microscope | - |
| 59640 |
Sold
|
Hitachi S 4500 FE-SEM (Field Emission Scanning Electron Microscope) |
Hitachi | S 4500 | FE-SEM (Field Emission Scanning Electron Microscope) | 2, 3, 4, 5, 6, 12 inch |
| 59713 |
|
Hitachi S 8840 CD-SEM (Critical Dimension Scanning Electron Microscope) |
Hitachi | S 8840 | CD-SEM (Critical Dimension Scanning Electron Microscope) | - |